Inspection method, inspection apparatus, and plasma processing apparatus

ABSTRACT

In a disclosed inspection method, a substrate and an edge ring are placed on first and second regions, respectively. A first inspection circuit is connected to the substrate. The first inspection circuit has impedance. A second inspection circuit is connected to the edge ring. The second inspection circuit has impedance. A first electrical bias and a second electrical bias having a common bias frequency are applied to a first electrode in the first region and a second electrode in the second region, respectively. A voltage waveform of the substrate and a voltage waveform of the edge ring is acquired by using a waveform monitor.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is based on and claims the benefit of priority from Japanese Patent Application No. 2020-046635 filed on Mar. 17, 2020, the entire contents of which are incorporated herein by reference.

FIELD

Exemplary embodiments of the present disclosure relate to an inspection method and an inspection apparatus which are used in a plasma processing apparatus, and the plasma processing apparatus.

BACKGROUND

In the manufacture of electronic devices, a plasma processing apparatus is used. The plasma processing apparatus has a chamber and a substrate support. The substrate support has a lower electrode and an electrostatic chuck. The electrostatic chuck is provided on the lower electrode. The substrate support supports an edge ring. A substrate is placed in a region surrounded by the edge ring on the substrate support. Radio frequency bias power is supplied to the lower electrode in order to draw ions from plasma into the substrate. Japanese Unexamined Patent Publication No. 2019-36658 discloses such a plasma processing apparatus.

SUMMARY

In an exemplary embodiment, an inspection method is provided. The inspection method includes connecting a first inspection circuit to a substrate placed on a first region of a substrate support of a plasma processing apparatus. The first inspection circuit has impedance. The inspection method further includes connecting a second inspection circuit to an edge ring placed on a second region of the substrate support. The second inspection has impedance. The inspection method further includes applying a first electrical bias and a second electrical bias from a first bias power source and a second bias power source to a first electrode in the first region and a second electrode in the second region, respectively. The operation of applying a first electrical bias and a second electrical bias is performed in a state where the first inspection circuit is connected to the substrate and the second inspection circuit is connected to the edge ring. The first electrical bias and the second electrical bias has a common bias frequency. The inspection method further includes acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring by using a waveform monitor during the operation of applying a first electrical bias and a second electrical bias is performed.

The foregoing summary is illustrative only and is not intended to be in any way limiting. In addition to the illustrative aspects, exemplary embodiments, and features described above, further aspects, exemplary embodiments, and features will become apparent by reference to the drawings and the following detailed description.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a flowchart showing an inspection method according to an exemplary embodiment.

FIG. 2 schematically illustrates a plasma processing apparatus according to an exemplary embodiment.

FIG. 3 illustrates a configuration in a chamber of the plasma processing apparatus according to an exemplary embodiment.

FIG. 4 illustrates a first bias power source, a damping circuit, a first circuit, and a filter in a plasma processing apparatus according to an exemplary embodiment.

FIG. 5 illustrates a second bias power source, a damping circuit, a second circuit, and a filter in a plasma processing apparatus according to an exemplary embodiment.

FIG. 6 illustrates an inspection apparatus according to an exemplary embodiment together with the plasma processing apparatus.

FIG. 7 illustrates a configuration of a simulated circuit in the inspection apparatus according to an exemplary embodiment.

FIG. 8 illustrates a configuration of a simulated circuit according to another example.

FIGS. 9A and 9B respectively shows simulation results of voltage waveforms in a case where the simulated circuit shown in FIG. 7 and the simulated circuit shown in FIG. 8 are used in the plasma processing apparatus shown in FIG. 2 .

FIG. 10 illustrates a first bias power source, a damping circuit, a first circuit, and a filter in a plasma processing apparatus according to an exemplary embodiment.

FIG. 11 illustrates a second bias power source, a damping circuit, a second circuit, and a filter in a plasma processing apparatus according to an exemplary embodiment.

FIG. 12 schematically illustrates a plasma processing apparatus according to another exemplary embodiment.

FIG. 13 schematically illustrates a plasma processing apparatus according to still another exemplary embodiment.

DETAILED DESCRIPTION

Hereinafter, various exemplary embodiments will be described.

In an exemplary embodiment, an inspection method is provided. The inspection method includes connecting a first inspection circuit to a substrate placed on a first region of a substrate support of a plasma processing apparatus. The first inspection circuit has impedance. The inspection method further includes connecting a second inspection circuit to an edge ring placed on a second region of the substrate support. The second inspection has impedance. The inspection method further includes applying a first electrical bias and a second electrical bias from a first bias power source and a second bias power source to a first electrode in the first region and a second electrode in the second region, respectively. The operation of applying a first electrical bias and a second electrical bias is performed in a state where the first inspection circuit is connected to the substrate and the second inspection circuit is connected to the edge ring. The first electrical bias and the second electrical bias has a common bias frequency. The inspection method further includes acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring by using a waveform monitor during the operation of applying a first electrical bias and a second electrical bias is performed.

In the inspection method according to the above embodiment, a pseudo environment in a chamber during plasma generation is provided by the first inspection circuit and the second inspection circuit. Therefore, according to this inspection method, it becomes possible to inspect the voltage waveform of the substrate corresponding to the first electrical bias and the voltage waveform of the edge ring corresponding to the second electrical bias without generating plasma.

In an exemplary embodiment, the first bias power source is connected to the first electrode through a first circuit and the second bias power source is connected to the second electrode through a second circuit having one or more variable circuit elements. The inspection method may further include adjusting impedance of the second circuit. The impedance of the second circuit is adjusted such that the impedance of the second circuit is higher than impedance of the first circuit at the bias frequency. In addition, the impedance of the second circuit is adjusted by adjusting a variable element parameter of each of the one or more variable circuit elements to reduce a difference between the voltage waveform of the substrate and the voltage waveform of the edge ring. According to this embodiment, it becomes possible to set the impedance of the second circuit in advance to reduce the difference between the voltage waveform of the substrate corresponding to the first electrical bias and the voltage waveform of the edge ring corresponding to the second electrical bias.

In an exemplary embodiment, the inspection method may further include obtaining a relationship between each of a plurality of different setting levels of the second electrical bias and the variable element parameter of each of the one or more variable circuit elements. The relationship is obtained such that a time length for reaching a peak level from a base level in the voltage waveform of the edge ring that is acquired with respect to each of the plurality of different setting levels is maintained within a reference range. The voltage waveform of the edge ring is obtained by applying the first and second electrical biases to the first and second electrodes, respectively.

In an exemplary embodiment, the first circuit may have a first resistor and a first capacitor. The first resistor is connected between the first electrode and the first bias power source. The first capacitor is connected between a node on an electrical path connecting the first resistor with the first electrode and a ground. The second circuit may have a second resistor and a second capacitor. The second resistor is connected between the second electrode and the second bias power source. The second capacitor is connected between a node on an electrical path connecting the second resistor with the second electrode and a ground. The one or more variable circuit elements may include at least one of the second resistor or the second capacitor.

In an exemplary embodiment, the first circuit may have a first inductor and a first capacitor. The first inductor is connected between the first electrode and the first bias power source. The first capacitor is connected between a node on an electrical path connecting the first inductor with the first electrode and a ground. The second circuit may have a second inductor and a second capacitor. The second inductor is connected between the second electrode and the second bias power source. The second capacitor is connected between a node on an electrical path connecting the second inductor with the second electrode and a ground. The one or more variable circuit elements may include at least one of the second inductor or the second capacitor.

In an exemplary embodiment, the first inspection circuit may have impedance corresponding to impedance of a plasma sheath on the substrate. The second inspection circuit may have impedance corresponding to impedance of a plasma sheath on the edge ring. In an exemplary embodiment, each of the first inspection circuit and the second inspection circuit may include a diode, a resistor, and a capacitor connected in parallel with each other.

In an exemplary embodiment, the operation of acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring is performed in a state where a third inspection circuit is connected to the substrate through the first inspection circuit and connected to the edge ring through the second inspection circuit. In an exemplary embodiment, the third inspection circuit may have impedance corresponding to impedance of plasma.

In an exemplary embodiment, the operation of acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring may be performed, further using a fourth inspection circuit and a fifth inspection circuit. The fourth inspection circuit has impedance. The fifth inspection circuit has impedance. The fourth inspection circuit is connected to the substrate through the third inspection circuit and the first inspection circuit. The fifth inspection circuit is connected to the edge ring through the third inspection circuit and the second inspection circuit. In an exemplary embodiment, the fourth inspection circuit may have impedance corresponding to impedance of a plasma sheath that is generated further above a plasma sheath on the substrate with the plasma interposed therebetween. The fifth inspection circuit may have impedance corresponding to impedance of a plasma sheath that is generated further above a plasma sheath on the edge ring with the plasma interposed therebetween.

In an exemplary embodiment, each of the first electrical bias and the second electrical bias may be a pulse wave that includes a pulse of a negative voltage and is periodically generated at a cycle that is defined by the bias frequency. The pulse of the negative voltage may be a pulse of a negative direct-current voltage.

In an exemplary embodiment, each of the first electrical bias and the second electrical bias may be radio frequency power having the bias frequency.

In another exemplary embodiment, an inspection apparatus is provided. The inspection apparatus includes a first inspection circuit, a second inspection, and a waveform monitor. The first inspection circuit is configured to be connectable to a substrate placed on a first region of a substrate support of a plasma processing apparatus. The first inspection circuit has impedance. The second inspection circuit is configured to be connectable to an edge ring placed on a second region of the substrate support. The second inspection circuit has impedance. The waveform monitor is configured to acquire a voltage waveform of the substrate and a voltage waveform of the edge ring in a state where first and second electrical biases are respectively applied to a first electrode in the first region and a second electrode in the second region. The first and second electrical biases has a common bias frequency. In an exemplary embodiment, the first inspection circuit may have impedance corresponding to impedance of a plasma sheath on the substrate. The second inspection circuit may have impedance corresponding to impedance of a plasma sheath on the edge ring.

Hereinafter, various exemplary embodiments will be described in detail with reference to the drawings. In the drawings, the same or equivalent portions are denoted by the same reference symbols.

FIG. 1 is a flowchart showing an inspection method according to an exemplary embodiment. The inspection method shown in FIG. 1 is performed in order to acquire a voltage waveform of a substrate and a voltage waveform of an edge ring in a plasma processing apparatus. FIG. 2 schematically illustrates a plasma processing apparatus to which the inspection method according to an exemplary embodiment can be applied. FIG. 3 illustrates a configuration in a chamber of the plasma processing apparatus according to an exemplary embodiment. The inspection method shown in FIG. 1 (hereinafter referred to as a “method MT”) may be applied to a plasma processing apparatus 1 shown in FIGS. 2 and 3 .

The plasma processing apparatus 1 is a capacitively coupled plasma processing apparatus. The plasma processing apparatus 1 is provided with a chamber 10. The chamber 10 provides an internal space 10 s therein. The central axis of the internal space 10 s is an axis AX which extends in the vertical direction. In an embodiment, the chamber 10 includes a chamber body 12. The chamber body 12 has a substantially cylindrical shape. The internal space 10 s is provided in the chamber body 12. The chamber body 12 is formed of, for example, aluminum. The chamber body 12 is electrically grounded. A film having plasma resistance is formed on the inner wall surface of the chamber body 12, that is, the wall surface defining the internal space 10 s. This film may be a ceramic film such as a film formed by anodization or a film formed of yttrium oxide.

A passage 12 p is formed in a side wall of the chamber body 12. A substrate W passes through the passage 12 p when it is transferred between the internal space 10 s and the outside of the chamber 10. A gate valve 12 g is provided along the side wall of the chamber body 12 for opening and closing of the passage 12 p.

The plasma processing apparatus 1 is further provided with a substrate support 16. The substrate support 16 is configured to support the substrate W placed thereon in the chamber 10. The substrate W has a substantially disk shape. The substrate support 16 is supported by a support 17. The support 17 extends upward from a bottom portion of the chamber body 12. The support 17 has a substantially cylindrical shape. The support 17 is formed of an insulating material such as quartz.

The substrate support 16 has a lower electrode 18 and an electrostatic chuck 20. The lower electrode 18 and the electrostatic chuck 20 are provided in the chamber 10. The lower electrode 18 is formed of a conductive material such as aluminum and has a substantially disk shape.

A flow path 18 f is formed in the lower electrode 18. The flow path 18 f is a flow path for a heat exchange medium. As the heat exchange medium, for example, a liquid refrigerant is used. A supply device for the heat exchange medium (for example, a chiller unit) is connected to the flow path 18 f. The supply device is provided outside the chamber 10. The heat exchange medium is supplied from the supply device to the flow path 18 f through a pipe 23 a. The heat exchange medium supplied to the flow path 18 f is returned to the supply device through a pipe 23 b.

The electrostatic chuck 20 is provided on the lower electrode 18. As shown in FIG. 2 , the electrostatic chuck 20 has a dielectric portion 20 d and an electrode 21 a. The electrostatic chuck 20 may further has an electrode 22 a and an electrode 22 b. When the substrate W is processed in the internal space 10 s, the substrate W is placed on the electrostatic chuck 20 and is held by the electrostatic chuck 20. Further, an edge ring ER is mounted on the substrate support 16. The edge ring ER is a plate having a substantially ring shape. The edge ring ER has electrical conductivity. The edge ring ER is formed of, for example, silicon or silicon carbide. As shown in FIG. 3 , the edge ring ER is mounted on the substrate support 16 such that the central axis thereof coincides with the axis AX. The substrate W accommodated in the chamber 10 is disposed on the electrostatic chuck 20 and in a region surrounded by the edge ring ER.

The plasma processing apparatus 1 may be further provided with a gas line 25. The gas line 25 supplies a heat transfer gas, for example, a He gas, from a gas supply mechanism to a gap between the upper surface of the electrostatic chuck 20 (a first region to be described later) and the rear surface (lower surface) of the substrate W.

The plasma processing apparatus 1 may be further provided with an outer peripheral portion 28 and an outer peripheral portion 29. The outer peripheral portion 28 extends upward from the bottom portion of the chamber body 12. The outer peripheral portion 28 has a substantially cylindrical shape and extends along the outer periphery of the support 17. The outer peripheral portion 28 is formed of a conductive material. The outer peripheral portion 28 is electrically grounded. A film having plasma resistance is formed on the surface of the outer peripheral portion 28. This film may be a ceramic film such as a film formed by anodization or a film formed of yttrium oxide.

The outer peripheral portion 29 is provided on the outer peripheral portion 28. The outer peripheral portion 29 is formed of a material having insulation properties. The outer peripheral portion 29 is formed of ceramic such as quartz, for example. The outer peripheral portion 29 has a substantially cylindrical shape. The outer peripheral portion 29 extends along the outer peripheries of the lower electrode 18 and the electrostatic chuck 20.

The plasma processing apparatus 1 is further provided with an upper electrode 30. The upper electrode 30 is provided above the substrate support 16. The upper electrode 30 closes an upper opening of the chamber body 12 together with a member 32. The member 32 has insulation properties. The upper electrode 30 is supported on an upper portion of the chamber body 12 through the member 32.

The upper electrode 30 includes a ceiling plate 34 and a support 36. The lower surface of the ceiling plate 34 defines the internal space 10 s. A plurality of gas discharge holes 34 a are formed in the ceiling plate 34. Each of the plurality of gas discharge holes 34 a penetrates the ceiling plate 34 in a plate thickness direction (the vertical direction). The ceiling plate 34 is formed of, for example, silicon. Alternatively, the ceiling plate 34 may have a structure in which a plasma-resistant film is provided on the surface of a member made of aluminum. This film may be a ceramic film such as a film formed by anodization or a film formed of yttrium oxide.

The support 36 detachably supports the ceiling plate 34. The support 36 is formed of a conductive material such as aluminum, for example. A gas diffusion chamber 36 a is provided in the interior of the support 36. A plurality of gas holes 36 b extend downward from the gas diffusion chamber 36 a. The plurality of gas holes 36 b communicate with the plurality of gas discharge holes 34 a, respectively. A gas introduction port 36 c is formed in the support 36. The gas introduction port 36 c is connected to the gas diffusion chamber 36 a. A gas supply pipe 38 is connected to the gas introduction port 36 c.

A gas source group 40 is connected to the gas supply pipe 38 through a valve group 41, a flow rate controller group 42, and a valve group 43. The gas source group 40, the valve group 41, the flow rate controller group 42, and the valve group 43 configure a gas supply unit. The gas source group 40 includes a plurality of gas sources. Each of the valve group 41 and the valve group 43 includes a plurality of valves (for example, on-off valves). The flow rate controller group 42 includes a plurality of flow rate controllers. Each of the plurality of flow rate controllers of the flow rate controller group 42 is a mass flow controller or a pressure control type flow rate controller. Each of the plurality of gas sources of the gas source group 40 is connected to the gas supply pipe 38 through a corresponding valve of the valve group 41, a corresponding flow rate controller of the flow rate controller group 42, and a corresponding valve of the valve group 43. The plasma processing apparatus 1 can supply gases from one or more gas sources selected from the plurality of gas sources of the gas source group 40 to the internal space 10 s at individually adjusted flow rates.

A baffle plate 48 is provided between the outer peripheral portion 28 and the side wall of the chamber body 12. The baffle plate 48 may be configured, for example, by coating a member made of aluminum with ceramic such as yttrium oxide. A number of through-holes are formed in the baffle plate 48. An exhaust pipe 52 is connected to the bottom portion of the chamber body 12 below the baffle plate 48. An exhaust device 50 is connected to the exhaust pipe 52. The exhaust device 50 has a pressure controller such as an automatic pressure control valve, and a vacuum pump such as a turbo molecular pump, and can reduce the pressure in the internal space 10 s.

Hereinafter, the substrate support 16 will be described in detail. As described above, the substrate support 16 has the lower electrode 18 and the electrostatic chuck 20. As shown in FIG. 2 , the plasma processing apparatus 1 has a radio frequency power source 57. The radio frequency power source 57 is connected to the lower electrode 18 through a matcher 58. The radio frequency power source 57 is a power source that generates radio frequency power for plasma generation. The radio frequency power generated by the radio frequency power source 57 has a frequency within the range of 27 to 100 MHz, for example, a frequency of 40 MHz or 60 MHz. The matcher 58 has a matching circuit for matching the impedance on the load side (the lower electrode 18 side) of the radio frequency power source 57 with the output impedance of the radio frequency power source 57. The radio frequency power source 57 may not be electrically connected to the lower electrode 18, and may be connected to the upper electrode 30 through the matcher 58.

In the plasma processing apparatus 1, a radio frequency electric field is generated in the chamber 10 by the radio frequency power from the radio frequency power source 57. The gas in the chamber 10 is excited by the generated radio frequency electric field. As a result, plasma is generated in the chamber 10. The substrate W is processed with chemical species such as ions and/or radicals from the generated plasma.

The substrate support 16 has a first region 21 and a second region 22. The first region 21 is a central region of the substrate support 16. The first region 21 includes the central region of the electrostatic chuck 20 and the central region of the lower electrode 18. The second region 22 extends in a circumferential direction on the outside in a radial direction with respect to the first region 21. The second region 22 includes a peripheral edge region of the electrostatic chuck 20 and a peripheral edge region of the lower electrode 18. In the plasma processing apparatus 1, the first region 21 and the second region 22 are configured from a single electrostatic chuck and are integrated with each other. In FIG. 2 , the boundary between the first region 21 and the second region 22 is indicated by a broken line. In another embodiment, the first region 21 and the second region 22 may be configured from individual electrostatic chucks.

The first region 21 is configured to support the substrate W placed thereon (that is, on the upper surface thereof). The first region 21 is a region having a disk shape as an example. The central axis of the first region 21 substantially coincides with the axis AX. The first region 21 shares the dielectric portion 20 d with the second region 22. The dielectric portion 20 d is formed of a dielectric such as aluminum nitride or aluminum oxide. The dielectric portion 20 d has a substantially disk shape. In an embodiment, the thickness of the dielectric portion 20 d in the second region 22 is smaller than the thickness of the dielectric portion 20 d in the first region 21. The position in the vertical direction of the upper surface of the dielectric portion 20 d in the second region 22 may be lower than the position in the vertical direction of the upper surface of the dielectric portion 20 d in the first region 21.

The first region 21 has the electrode 21 a (chuck electrode). The electrode 21 a is an electrode having a film shape and is provided in the dielectric portion 20 d in the first region 21. A direct-current power source 55 is connected to the electrode 21 a through a switch 56. When a direct-current voltage from the direct-current power source 55 is applied to the electrode 21 a, an electrostatic attraction force is generated between the first region 21 and the substrate W. Due to the generated electrostatic attraction force, the substrate W is attracted to the first region 21 and held by the first region 21.

The first region 21 further has a first electrode 21 c. The first electrode 21 c is an electrode having a film shape and is provided in the dielectric portion 20 d in the first region 21. The electrode 21 a may extend closer to the upper surface of the first region 21 than the first electrode 21 c in the vertical direction.

The plasma processing apparatus 1 is further provided with a first bias power source 61. The first bias power source 61 is electrically connected to the first electrode 21 c through a first circuit 63. The first bias power source 61 generates a first electrical bias. The first electrical bias is applied to the first electrode 21 c. In an embodiment, the first electrical bias is a pulse wave that includes a pulse of a negative direct-current voltage and is periodically generated at a cycle that is defined by a bias frequency. The bias frequency may be a frequency in the range of 200 kHz to 13.56 MHz. The voltage level of the pulse wave may have a voltage value of 0 V or higher in a period other than a period in which the pulse of the negative direct-current voltage continues in the cycle, and the pulse wave may be, for example, a pulse wave having a positive or negative voltage value. Alternatively, the voltage of the pulse wave may have an absolute value lower than the absolute value of the voltage of the pulse in a period other than the period in which the pulse of the negative direct-current voltage continues in the cycle. The voltage level of the pulse may temporally change within the cycle, and the pulse may be a pulse voltage such as a triangular wave or an impulse.

FIG. 4 illustrates a first bias power source, a damping circuit, a first circuit, and a filter in a plasma processing apparatus according to an exemplary embodiment. As shown in FIGS. 2 and 4 , the plasma processing apparatus 1 may be further provided with a damping circuit 62 and a filter 64. The damping circuit 62 may be connected between the first bias power source 61 and the first circuit 63. The filter 64 may be connected between the first circuit 63 and the first electrode 21 c.

As shown in FIG. 4 , in an embodiment, the first bias power source 61 includes a variable direct-current power source 61 p, a switch 61 a, and a switch 61 b. The variable direct-current power source 61 p is a direct-current power source that generates a negative direct-current voltage. The level of the direct-current voltage that is generated by the variable direct-current power source 61 p is variable. The variable direct-current power source 61 p is connected to an output 61 o through the switch 61 a. The output 61 o is connected to the ground through the switch 61 b. The switch 61 a and the switch 61 b can be controlled by a controller MC (described later). In a case where the switch 61 a is in a conduction state and the switch 61 b is in a non-conduction state, a negative direct-current voltage is output from the output 61 o. In a case where the switch 61 a is in the non-conduction state and the switch 61 b is in the conduction state, the voltage level of the output 61 o becomes 0 V. A pulse wave, which is the first electrical bias, can be obtained by controlling the conduction state of each of the switch 61 a and the switch 61 b.

The damping circuit 62 is connected between the output 61 o of the first bias power source 61 and the first circuit 63. In an embodiment, the damping circuit 62 has a resistor 62 r and a capacitor 62 c. One end of the resistor 62 r is connected to the output 61 o of the first bias power source 61. One end of the capacitor 62 c is connected to a node 62 n on an electrical path connecting the other end of the resistor 62 r with the first circuit 63. The other end of the capacitor 62 c is grounded.

The impedance of the first circuit 63 may be variable. The first circuit 63 has one or more variable circuit elements. Each of the one or more variable circuit elements has a variable element parameter. In an embodiment, the first circuit 63 has a first variable resistor 63 r and a first variable capacitor 63 c as the one or more variable circuit elements. In the first circuit 63, the variable element parameters are the resistance value of the first variable resistor 63 r and the capacitance of the first variable capacitor 63 c. One end of the first variable resistor 63 r is connected to the output 61 o of the first bias power source 61 through the damping circuit 62. One end of the first variable capacitor 63 c is connected to a node 63 n on an electrical path connecting the other end of the first variable resistor 63 r with the first electrode 21 c. The other end of the first variable capacitor 63 c is grounded. The impedance of the first circuit 63 is set by the controller MC. The impedance of the first circuit 63 is controlled by setting the variable element parameter of each of one or more variable circuit elements of the first circuit 63, for example, the resistance value of the first variable resistor 63 r and the capacitance of the first variable capacitor 63 c, by the controller MC. The impedance of the first circuit 63 may be constant rather than variable. That is, a fixed resistor may be used instead of the first variable resistor 63 r, and a fixed capacitor may be used instead of the first variable capacitor 63 c.

The filter 64 is connected between the node 63 n and the first electrode 21 c. The filter 64 is an electric filter configured to block or attenuate the radio frequency power from the radio frequency power source 57. The filter 64 includes, for example, an inductor connected between the node 63 n and the first electrode 21 c.

As shown in FIG. 2 , the second region 22 extends to surround the first region 21. The second region 22 is a substantially annular region. The central axis of the second region 22 substantially coincides with the axis AX. The second region 22 is configured to support the edge ring ER placed thereon (that is, on the upper surface thereof). The second region 22 shares the dielectric portion 20 d with the first region 21.

In an embodiment, the second region 22 may hold the edge ring ER by an electrostatic attraction force. In this embodiment, the second region 22 may have one or more electrodes (chuck electrodes). In the embodiment shown in FIG. 2 , the second region 22 has a pair of electrodes, that is, the electrode 22 a and the electrode 22 b. The electrode 22 a and the electrode 22 b are provided in the dielectric portion 20 d in the second region 22. The electrode 22 a and the electrode 22 b configure a bipolar electrode. Each of the electrode 22 a and the electrode 22 b is an electrode having a film shape. The electrode 22 a and the electrode 22 b may extend at substantially the same height position in the vertical direction.

A direct-current power source 71 is connected to the electrode 22 a through a switch 72 and a filter 73. The filter 73 is an electric filter configured to block or attenuate the radio frequency power and the first and second electrical biases. A direct-current power source 74 is connected to the electrode 22 b through a switch 75 and a filter 76. The filter 76 is an electric filter configured to block or reduce the radio frequency power and the first and second electrical biases.

The direct-current power source 71 and the direct-current power source 74 apply direct-current voltages to the electrodes 22 a and 22 b, respectively, such that a potential difference is generated between the electrode 22 a and the electrode 22 b. The setting potential of each of the electrodes 22 a and 22 b may be any of positive potential, negative potential, and 0 V. For example, the potential of the electrode 22 a may be set to positive potential, and the potential of the electrode 22 b may be set to negative potential. Further, the potential difference between the electrode 22 a and the electrode 22 b may be formed by using a single direct-current power source instead of the two direct-current power sources.

When a potential difference occurs between the electrode 22 a and the electrode 22 b, an electrostatic attraction force is generated between the second region 22 and the edge ring ER. The edge ring ER is attracted to the second region 22 by the generated electrostatic attraction force and held by the second region 22.

The second region 22 further has a second electrode 22 c. The second electrode 22 c is an electrode having a film shape. The second electrode 22 c is provided in the dielectric portion 20 d in the second region 22. The second electrode 22 c is separated from the first electrode 21 c. The electrode 22 a and the electrode 22 b may extend closer to the upper surface of the second region 22 than the second electrode 22 c in the vertical direction.

The plasma processing apparatus 1 is further provided with a second bias power source 81. The second bias power source 81 is electrically connected to the second electrode 22 c through a second circuit 83. The second bias power source 81 generates a second electrical bias. The second electrical bias is applied to the second electrode 22 c. In an embodiment, the second electrical bias is a pulse wave that includes a pulse of a negative direct-current voltage and is periodically generated at a cycle that is defined by the bias frequency. The bias frequency of the second electrical bias is the same as the bias frequency of the first electrical bias. The voltage level of the pulse wave may have a voltage value of 0 V or higher in a period other than a period in which the pulse of the negative direct-current voltage continues in the cycle, and the pulse wave may be, for example, a pulse wave having a positive or negative voltage value. Alternatively, the voltage of the pulse wave may have an absolute value lower than the absolute value of the voltage of the pulse in a period other than the period in which the pulse of the negative direct-current voltage continues in the cycle. The voltage level of the pulse may temporally change within the cycle, and the pulse may be a pulse voltage such as a triangular wave or an impulse.

FIG. 5 illustrates a second bias power source, a damping circuit, a second circuit, and a filter in a plasma processing apparatus according to an exemplary embodiment. As shown in FIGS. 2 and 5 , the plasma processing apparatus 1 may be further provided with a damping circuit 82 and a filter 84. The damping circuit 82 may be connected between the second bias power source 81 and the second circuit 83. The filter 84 may be connected between the second circuit 83 and the second electrode 22 c.

As shown in FIG. 5 , in an embodiment, the second bias power source 81 includes a variable direct-current power source 81 p, a switch 81 a, and a switch 81 b. The variable direct-current power source 81 p is a direct-current power source that generates a negative direct-current voltage. The level of the direct-current voltage that is generated by the variable direct-current power source 81 p is variable. The variable direct-current power source 81 p is connected to an output 81 o through the switch 81 a. The output 81 o is connected to the ground through the switch 81 b. The switch 81 a and the switch 81 b can be controlled by the controller MC (described later). In a case where the switch 81 a is in a conduction state and the switch 81 b is in a non-conduction state, a negative direct-current voltage is output from the output 81 o. In a case where the switch 81 a is in the non-conduction state and the switch 81 b is in the conduction state, the voltage level of the output 81 o becomes 0 V. A pulse wave, which is the second electrical bias, can be obtained by controlling the conduction state of each of the switch 81 a and the switch 81 b.

The damping circuit 82 is connected between the output 81 o of the second bias power source 81 and the second circuit 83. In an embodiment, the damping circuit 82 has a resistor 82 r and a capacitor 82 c. One end of the resistor 82 r is connected to the output 81 o of the second bias power source 81. One end of the capacitor 82 c is connected to a node 82 n on an electrical path connecting the other end of the resistor 82 r with the second circuit 83. The other end of the capacitor 82 c is grounded.

The impedance of the second circuit 83 may be variable. The second circuit 83 has one or more variable circuit elements. Each of the one or more variable circuit elements has a variable element parameter. In an embodiment, the second circuit 83 has a second variable resistor 83 r and a second variable capacitor 83 c as the one or more variable circuit elements. In the second circuit 83, the variable element parameters are the resistance value of the second variable resistor 83 r and the capacitance of the second variable capacitor 83 c. One end of the second variable resistor 83 r is connected to the output 81 o of the second bias power source 81 through the damping circuit 82. One end of the second variable capacitor 83 c is connected to a node 83 n on an electrical path connecting the other end of the second variable resistor 83 r with the second electrode 22 c. The other end of the second variable capacitor 83 c is grounded. The second circuit 83 has impedance higher than the impedance of the first circuit 63 at a common bias frequency of the first electrical bias and the second electrical bias. In an embodiment, the impedance of the first circuit 63 and the impedance of the second circuit 83 are set such that the ratio between an electric current that is supplied to the substrate W and an electric current that is supplied to the edge ring ER is equal to the ratio between an area of the substrate W and an area of the edge ring ER. The impedance of the second circuit 83 is set by the controller MC. The impedance of the second circuit 83 is controlled by setting the variable element parameter of each of one or more variable circuit elements of the second circuit 83, for example, the resistance value of the second variable resistor 83 r and the capacitance of the second variable capacitor 83 c, by the controller MC.

The filter 84 is connected between the node 83 n and the second electrode 22 c. The filter 84 is an electric filter configured to block or attenuate the radio frequency power from the radio frequency power source 57. The filter 84 includes, for example, an inductor connected between the node 83 n and the second electrode 22 c.

The second region 22 may further have a gas line 22 g. The gas line 22 g is a gas line provided for supplying a heat transfer gas, for example, a He gas, to the gap between the second region 22 and the edge ring ER. The gas line 22 g is connected to a gas supply mechanism 86 which is a heat transfer gas source.

In an embodiment, as shown in FIG. 3 , the plasma processing apparatus 1 may be further provided with the controller MC. The controller MC is a computer which includes a processor, a storage device, an input device, a display device, and the like, and controls each part of the plasma processing apparatus 1. Specifically, the controller MC executes a control program stored in the storage device, and controls each part of the plasma processing apparatus 1, based on recipe data stored in the storage device. The process designated by the recipe data is performed in the plasma processing apparatus 1 under the control by the controller MC. Further, the method MT may be performed under the control of each part of the plasma processing apparatus 1 and each part of an inspection apparatus (described later) by the controller MC.

Here, the edge ring ER wears by being exposed to plasma, so that the thickness thereof decreases. In a case where the thickness of the edge ring ER becomes smaller than the initial thickness thereof, the upper end of a sheath (plasma sheath) is inclined in the vicinity of an edge of the substrate W. Therefore, in a case where the thickness of the edge ring ER becomes smaller than the initial thickness thereof, an incident direction of ions with respect to the edge of the substrate W is inclined with respect to the vertical direction. In an embodiment, the controller MC may control the second bias power source 81 to increase the setting level of the second electrical bias according to a decrease in the thickness of the edge ring ER. In a case where the second electrical bias is the pulse wave described above, the setting level of the second electrical bias is the absolute value of the voltage of the pulse in the pulse wave. When the setting level of the second electrical bias is increased, the thickness of the sheath increases above the edge ring ER, so that the inclination of the incident direction of the ions with respect to the edge of the substrate W can be corrected.

The controller MC may specify the setting level of the second electrical bias corresponding to the thickness of the edge ring ER by using a function or a table stored in the storage device thereof. The thickness of the edge ring ER may be measured optically or electrically, or may be estimated from a time in which the edge ring ER is exposed to plasma.

Further, the controller MC may control the variable element parameter of each of the one or more variable circuit elements of the second circuit 83 to reduce the impedance of the second circuit 83 according to the decrease in the thickness of the edge ring ER. The impedance of the second circuit 83 is reduced according to an increase in the setting level of the second electrical bias, whereby an increase in a time length that is required to reach a peak level from a base level in the voltage waveform of the edge ring ER is suppressed.

In an embodiment, the controller MC may specify the variable element parameter of each of the one or more variable circuit elements of the second circuit 83 corresponding to the setting level of the second electrical bias by using a function or a table stored in the storage device thereof. The variable element parameter of each of the one or more variable circuit elements of the second circuit 83 corresponding to the thickness of the edge ring ER may be directly associated with the thickness of the edge ring ER.

In the plasma processing apparatus 1, the first electrode 21 c and the substrate W form a first capacitor element. Further, the second electrode 22 c and the edge ring ER form a second capacitor element. The region of the edge ring ER is smaller than the region of the substrate W. Therefore, the capacitance of the second capacitor element is lower than the capacitance of the first capacitor element. Therefore, when an electric current that is supplied to the first capacitor element and an electric current that is supplied to the second capacitor element are the same as each other, the voltage waveform of the edge ring ER changes at a higher speed than the voltage waveform of the substrate W. In the plasma processing apparatus 1, the first circuit 63 is provided between the first electrode 21 c and the first bias power source 61, and the second circuit 83 is provided between the second electrode 22 c and the second bias power source 81. At the bias frequency, the impedance of the second circuit 83 is set to impedance higher than the impedance of the first circuit 63. Therefore, according to the plasma processing apparatus 1, the difference between the voltage waveform of the substrate W and the voltage waveform of the edge ring ER is reduced.

The method MT will be described with reference to FIG. 1 again. In the following description, FIGS. 6 and 7 will be referred to in addition to FIG. 1 . FIG. 6 illustrates an inspection apparatus according to an exemplary embodiment together with the plasma processing apparatus. FIG. 7 illustrates a configuration of a simulated circuit in the inspection apparatus according to an exemplary embodiment. An inspection apparatus 100 shown in FIG. 6 is used in the method MT. The inspection apparatus 100 includes a simulated circuit 110 and a waveform monitor 120. The simulated circuit 110 is a circuit configured to simulate at least the plasma sheath in the chamber 10. The waveform monitor 120 is configured to acquire the voltage waveform of the substrate W and the voltage waveform of the edge ring ER. The waveform monitor 120 is, for example, an oscilloscope.

As shown in FIG. 7 , the simulated circuit 110 includes a first inspection circuit 111 and a second inspection circuit 112. In an embodiment, the simulated circuit 110 may further include a third inspection circuit 113, a fourth inspection circuit 114, and a fifth inspection circuit 115.

The first inspection circuit 111 is a circuit that simulates the plasma sheath on the substrate W. The first inspection circuit 111 has impedance. The first inspection circuit 111 may be configured to have impedance corresponding to the impedance of the plasma sheath on the substrate W. In an embodiment, the first inspection circuit 111 has a diode 111 d, a resistor 111 a, and a capacitor 111 c. The diode 111 d, the resistor 111 a, and the capacitor 111 c are connected in parallel with each other. The anode of the diode 111 d, one end of the resistor 111 a, and one end of the capacitor 111 c are connected to a terminal 110 a of the simulated circuit 110. The cathode of the diode 111 d is connected to one end of a resistor 111 b. The other end of the resistor 111 a, the other end of the capacitor 111 c, and the other end of the resistor 111 b are connected to one end of a resistor 113 a of the third inspection circuit 113. Each of the resistor 111 a and the resistor 111 b may be a variable resistor. The capacitor 111 c may be a variable capacitor.

The second inspection circuit 112 is a circuit that simulates the plasma sheath on the edge ring ER. The second inspection circuit 112 has impedance. The second inspection circuit 112 may be configured to have impedance corresponding to the impedance of the plasma sheath on the edge ring ER. In an embodiment, the second inspection circuit 112 has a diode 112 d, a resistor 112 a, and a capacitor 112 c. The diode 112 d, the resistor 112 a, and the capacitor 112 c are connected in parallel with each other. The anode of the diode 112 d, one end of the resistor 112 a, and one end of the capacitor 112 c are connected to a terminal 110 b of the simulated circuit 110. The cathode of the diode 112 d is connected to one end of a resistor 112 b. The other end of the resistor 112 a, the other end of the capacitor 112 c, and the other end of the resistor 112 b are connected to one end of a resistor 113 c of the third inspection circuit 113. Each of the resistor 112 a and the resistor 112 b may be a variable resistor. The capacitor 112 c may be a variable capacitor.

The third inspection circuit 113 is a circuit that simulates plasma. The third inspection circuit 113 has impedance. The third inspection circuit 113 may be configured to have impedance corresponding to the impedance of the plasma. In an embodiment, the third inspection circuit 113 has the resistor 113 a, a resistor 113 b, the resistor 113 c, a resistor 113 d, and a resistor 113 e. The resistor 113 a and the resistor 113 b are connected in series with each other. The resistor 113 c and the resistor 113 d are connected in series with each other. The resistor 113 e is connected between a node between the other end of the resistor 113 a and one end of the resistor 113 b and a node between the other end of the resistor 113 c and one end of the resistor 113 d. Each of the resistor 113 a, the resistor 113 b, the resistor 113 c, the resistor 113 d, and the resistor 113 e may be a variable resistor.

The fourth inspection circuit 114 is a circuit that simulates a plasma sheath that is generated further above the plasma sheath on the substrate W with plasma interposed therebetween. The fourth inspection circuit 114 has impedance. The fourth inspection circuit 114 may be configured to have impedance corresponding to the impedance of the plasma sheath that is generated further above the plasma sheath on the substrate W with plasma interposed therebetween. That is, the fourth inspection circuit may be configured to have impedance corresponding to the impedance of the plasma sheath that is generated between the plasma and the upper electrode 30 above the substrate W. In an embodiment, the fourth inspection circuit 114 has a diode 114 d, a resistor 114 a, and a capacitor 114 c. The diode 114 d, the resistor 114 a, and the capacitor 114 c are connected in parallel with each other. The cathode of the diode 114 d, one end of the resistor 114 a, and one end of the capacitor 114 c are connected to the other end of the resistor 113 b of the third inspection circuit 113. The anode of the diode 114 d is connected to one end of a resistor 114 b. The other end of the resistor 114 a, the other end of the capacitor 114 c, and the other end of the resistor 114 b are grounded. Each of the resistor 114 a and the resistor 114 b may be a variable resistor. The capacitor 114 c may be a variable capacitor.

The fifth inspection circuit 115 is a circuit that simulates a plasma sheath that is generated further above the plasma sheath on the edge ring ER with plasma interposed therebetween. The fifth inspection circuit 115 has impedance. The fifth inspection circuit 115 may be configured to have impedance corresponding to the impedance of the plasma sheath that is generated further above the plasma sheath on the edge ring ER with plasma interposed therebetween. The fifth inspection circuit may be configured to have impedance corresponding to the impedance of the plasma sheath that is generated between the plasma and the upper electrode 30 above the edge ring ER. In an embodiment, the fifth inspection circuit 115 has a diode 115 d, a resistor 115 a, and a capacitor 115 c. The diode 115 d, the resistor 115 a, and the capacitor 115 c are connected in parallel with each other. The cathode of the diode 115 d, one end of the resistor 115 a, and one end of the capacitor 115 c are connected to the other end of the resistor 113 d of the third inspection circuit 113. The anode of the diode 115 d is connected to one end of a resistor 115 b. The other end of the resistor 115 a, the other end of the capacitor 115 c, and the other end of the resistor 115 b are grounded. Each of the resistor 115 a and the resistor 115 b may be a variable resistor. The capacitor 115 c may be a variable capacitor.

As shown in FIG. 1 , the method MT includes step ST1, step ST2, step ST3, and step ST4. In step ST1, the first inspection circuit 111 is connected to the substrate W. That is, the terminal 110 a of the simulated circuit 110 is connected to the substrate W. In step ST2, the second inspection circuit 112 is connected to the edge ring ER. That is, the terminal 110 b of the simulated circuit 110 is connected to the edge ring ER. Step ST1 may be performed before step ST2, or may be performed after step ST2. Alternatively, step ST1 and step ST2 may be performed at the same time.

In the method MT, the waveform monitor 120 is connected to the substrate W and the edge ring ER before step ST3 is performed. Step ST3 is performed in a state where the first inspection circuit 111 is connected to the substrate W and the second inspection circuit 112 is connected to the edge ring ER. In step ST3, the first electrical bias is applied from the first bias power source 61 to the first electrode 21 c and the second electrical bias is applied from the second bias power source 81 to the second electrode 22 c. The setting level of the first electrical bias which is applied to the first electrode 21 c in step ST3 and the setting level of the second electrical bias may be the same. The radio frequency power may be applied from the radio frequency power source 57 to the lower electrode 18, while step ST3 is performed.

Step ST4 is performed while step ST3 is performed. In step ST4, the voltage waveform of the substrate W and the voltage waveform of the edge ring ER are acquired by using the waveform monitor 120. In the method MT, a pseudo environment in the chamber 10 during plasma generation is provided by the first inspection circuit 111 and the second inspection circuit 112. Therefore, according to the method MT, it becomes possible to inspect the voltage waveform of the substrate W corresponding to the first electrical bias and the voltage waveform of the edge ring ER corresponding to the second electrical bias without generating plasma.

As shown in FIG. 1 , the method MT may further include step ST5. In step ST5, the impedance of the second circuit 83 is adjusted. Specifically, the impedance of the second circuit 83 is set to impedance higher than the impedance of the first circuit 63 at the bias frequency. Further, the impedance of the second circuit 83 is adjusted to reduce the difference between the voltage waveform of the substrate W and the voltage waveform of the edge ring ER which are acquired in step ST4. In step ST5, the controller MC sets the variable element parameter of each of the one or more variable circuit elements of the second circuit 83, for example, the resistance value of the second variable resistor 83 r and the capacitance of the second variable capacitor 83 c, whereby the impedance of the second circuit 83 is adjusted. According to step ST5, it becomes possible to set the impedance of the second circuit 83 in advance to reduce the difference between the voltage waveform of the substrate W corresponding to the first electrical bias and the voltage waveform of the edge ring ER corresponding to the second electrical bias. The relationship between the setting level of the second electrical bias and the variable element parameter of each of the one or more variable circuit elements of the second circuit 83 adjusted in step ST5 may be stored in the storage device of the controller MC.

The method MT may further include step ST6. In step ST6, the relationship between each of a plurality of different setting levels of the second electrical bias and the variable element parameter of each of the one or more variable circuit elements of the second circuit 83 is obtained. In step ST6, the first electrical bias is applied from the first bias power source 61 to the first electrode 21 c, and the second electrical bias is applied from the second bias power source 81 to the second electrode 22 c. In step ST6, the setting level of the second electrical bias is sequentially changed to a plurality of different setting levels. In step ST6, the voltage waveform of the edge ring ER is acquired by the waveform monitor 120 in a state where the second electrical bias having each of the plurality of different setting levels is applied to the second electrode 22 c. In step ST6, the relationship is obtained such that a delay time length in the voltage waveform of the edge ring ER acquired with respect to each of the plurality of different setting levels is maintained within a reference range. For example, the relationship is obtained such that the delay time length is substantially the same as a constant time length. The delay time length is a time length for reaching a peak level from a base level in the voltage waveform of the edge ring ER. In a case where the second electrical bias is the pulse wave described above, the peak level is a peak level of the voltage of the edge ring ER corresponding to the pulse of the negative direct-current voltage. In a case where the second electrical bias is the pulse wave described above, the base level is a level of the voltage of the edge ring ER corresponding to the voltage of the pulse wave in a period other than a period in which the pulse of the negative direct-current voltage continues. The relationships obtained in steps ST5 and ST6 are stored in the storage device of the controller MC as the function or table described above. In step ST6, the variable element parameter of each of the one or more variable circuit elements of the first circuit 63 corresponding to each of the plurality of different setting levels may be obtained to maintain the delay time length in the voltage waveform of the edge ring ER within a reference range. Alternatively, both the variable element parameter of each of the one or more variable circuit elements of the first circuit 63 corresponding to each of the plurality of different setting levels and the variable element parameter of each of the one or more variable circuit elements of the second circuit 83 may be obtained.

Hereinafter, FIG. 8 will be referred to. FIG. 8 illustrates a configuration of a simulated circuit according to another example. The simulated circuit 110 shown in FIG. 8 may be used as the simulated circuit of the inspection apparatus 100. The simulated circuit 110 shown in FIG. 8 has the first inspection circuit 111 and the second inspection circuit 112, and does not have the third inspection circuit 113, the fourth inspection circuit 114, and the fifth inspection circuit 115. In the simulated circuit 110 shown in FIG. 8 , the other end of the resistor 111 a, the other end of the capacitor 111 c, and the other end of the resistor 111 b are grounded. Further, in the simulated circuit 110 shown in FIG. 8 , the other end of the resistor 112 a, the other end of the capacitor 112 c, and the other end of the resistor 112 b are grounded. FIGS. 9A and 9B are respectively shows simulation results of the voltage waveforms in a case where the simulated circuit shown in FIG. 7 and the simulated circuit shown in FIG. 8 are used in the plasma processing apparatus shown in FIG. 2 . In each of FIGS. 9A and 9B, the horizontal axis represents time and the vertical axis represents voltage. In each of FIGS. 9A and 9B, the waveform of the output voltage (the second electrical bias) of the second bias power source 81, the voltage waveform of the edge ring ER, and the voltage waveform of the substrate W are respectively indicated by a dashed-dotted line, a solid line, and a broken line. The voltage waveform of the edge ring ER shown in FIG. 9B has a slight difference from the voltage waveform of the edge ring ER shown in FIG. 9A on the positive voltage side. However, on the negative voltage side, it is approximately the same as the voltage waveform of the edge ring ER shown in FIG. 9A. Therefore, even the simulated circuit 110 that does not have the third inspection circuit 113, the fourth inspection circuit 114, and the fifth inspection circuit 115 can sufficiently reproduce the voltage waveform of the edge ring ER.

Hereinafter, FIGS. 10 and 11 will be referred to. FIG. 10 illustrates a first bias power source, a damping circuit, a first circuit, and a filter in a plasma processing apparatus according to an exemplary embodiment. FIG. 11 illustrates a second bias power source, a damping circuit, a second circuit, and a filter in a plasma processing apparatus according to an exemplary embodiment. As shown in FIG. 10 , the first circuit 63 may have a first variable inductor 63 i instead of the first variable resistor 63 r. Further, as shown in FIG. 11 , the second circuit 83 may have a second variable inductor 83 i instead of the second variable resistor 83 r. Although the example in which the first circuit includes the variable element is shown, the first circuit may not include the variable element.

Hereinafter, FIG. 12 will be referred to. FIG. 12 schematically illustrates a plasma processing apparatus according to another exemplary embodiment. A plasma processing apparatus 1B shown in FIG. 12 includes a radio frequency bias power source as the first bias power source 61. The plasma processing apparatus 1B includes a radio frequency bias power source as the second bias power source 81. In the plasma processing apparatus 1B, the first bias power source 61 is configured to generate radio frequency bias power having a bias frequency as the first electrical bias. The bias frequency is a frequency within the range of 200 kHz to 13.56 MHz, and is, for example, 400 kHz. In the plasma processing apparatus 1B, the first bias power source 61 is connected to the first electrode 21 c through a matcher 65 and the first circuit 63. The matcher 65 has a matching circuit for matching the impedance on the load side of the first bias power source 61 with the output impedance of the first bias power source 61.

Further, in the plasma processing apparatus 1B, the second bias power source 81 is configured to generate radio frequency bias power having a bias frequency as the second electrical bias. The bias frequency of the radio frequency bias power that is generated by the second bias power source 81 is the same as the bias frequency of the radio frequency bias power that is generated by the first bias power source 61. Further, in the plasma processing apparatus 1B, the second bias power source 81 is connected to the second electrode 22 c through a matcher 85 and the second circuit 83. The matcher 85 has a matching circuit for matching the impedance on the load side of the second bias power source 81 with the output impedance of the second bias power source 81. In the plasma processing apparatus 1B, the setting level of the second electrical bias that is controlled by the controller MC is a power level of the radio frequency bias power. Other configurations of the plasma processing apparatus 1B may be the same as the corresponding configurations of the plasma processing apparatus 1.

Hereinafter, FIG. 13 will be referred to. FIG. 13 schematically illustrates a plasma processing apparatus according to still another exemplary embodiment. In a plasma processing apparatus 1C shown in FIG. 13 , the electrode 22 a and the electrode 22 b are used as the second electrode 22 c. The electrical path extending from the output of the second bias power source 81 is branched into two branch paths in a subsequent stage of the second circuit 83 (or the filter 84), and the two branch paths are respectively connected to the electrode 22 a and the electrode 22 b through blocking capacitors 87 a and 87 b. Other configurations of the plasma processing apparatus 1C may be the same as the corresponding configurations of the plasma processing apparatus 1. Also in the plasma processing apparatus 1B, similar to the plasma processing apparatus 1C, the electrodes 22 a and 22 b may be used as the second electrode to which the second electrical bias is applied, and the second electrode 22 c separate from the electrodes 22 a and 22 b may be omitted.

While various exemplary embodiments have been described above, various additions, omissions, substitutions and changes may be made without being limited to the exemplary embodiments described above. Elements of the different embodiments may be combined to form another embodiment.

For example, in another embodiment, the plasma processing apparatus may be a capacitively coupled plasma processing apparatus different from the plasma processing apparatus 1. In another embodiment, the plasma processing apparatus may be another type of plasma processing apparatus. The other type of plasma processing apparatus may be an inductively coupled plasma processing apparatus, an electron cyclotron resonance (ECR) plasma processing apparatus, or a plasma processing apparatus that generates plasma by using surface waves such as microwaves.

Further, the first electrode 21 c and the second electrode 22 c may not be provided in the dielectric portion 20 d of the electrostatic chuck 20. Each of the first electrode 21 c and the second electrode 22 c may be provided in another dielectric portion provided between the electrostatic chuck 20 and the lower electrode 18.

Further, the simulated circuit 110 may have the first inspection circuit 111, the second inspection circuit 112, and the third inspection circuit 113, and may not have the fourth inspection circuit 114 and the fifth inspection circuit 115. In this case, the other end of the resistor 113 b and the other end of the resistor 113 d are grounded.

From the foregoing description, it will be appreciated that various embodiments of the present disclosure have been described herein for purposes of illustration, and that various modifications may be made without departing from the scope and spirit of the present disclosure. Accordingly, the various embodiments disclosed herein are not intended to be limiting, with the true scope and spirit being indicated by the following claims. 

What is claimed is:
 1. An inspection method comprising: connecting a first inspection circuit having impedance to a substrate placed on a first region of a substrate support of a plasma processing apparatus; connecting a second inspection circuit having impedance to an edge ring placed on a second region of the substrate support; applying a first electrical bias and a second electrical bias from a first bias power source and a second bias power source to a first electrode in the first region and a second electrode in the second region, respectively, in a state where the first inspection circuit is connected to the substrate and the second inspection circuit is connected to the edge ring, the first electrical bias and the second electrical bias having a common bias frequency; and acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring by using a waveform monitor while said applying a first electrical bias and a second electrical bias, wherein the first bias power source is connected to the first electrode through a first circuit, the second bias power source is connected to the second electrode through a second circuit having one or more variable circuit elements, the inspection method further comprises adjusting impedance of the second circuit, and the impedance of the second circuit is adjusted by adjusting a variable element parameter of each of the one or more variable circuit elements such that the impedance of the second circuit is higher than impedance of the first circuit at the bias frequency and a difference between the voltage waveform of the substrate and the voltage waveform of the edge ring is reduced.
 2. The inspection method according to claim 1, further comprising: obtaining a relationship between each of a plurality of different setting levels of the second electrical bias and the variable element parameter of each of the one or more variable circuit elements, wherein the relationship is obtained such that a time length for reaching a peak level from a base level in the voltage waveform of the edge ring that is acquired with respect to each of the plurality of different setting levels by applying the first electrical bias to the first electrode and applying the second electrical bias having each of the plurality of different setting levels to the second electrode is maintained within a reference range.
 3. The inspection method according to claim 2, wherein the first circuit has a first resistor connected between the first electrode and the first bias power source, and a first capacitor connected between a node on an electrical path connecting the first resistor with the first electrode and a ground, the second circuit has a second resistor connected between the second electrode and the second bias power source, and a second capacitor connected between a node on an electrical path connecting the second resistor with the second electrode and a ground, and the one or more variable circuit elements include at least one of the second resistor or the second capacitor.
 4. The inspection method according to claim 2, wherein the first circuit has a first inductor connected between the first electrode and the first bias power source, and a first capacitor connected between a node on an electrical path connecting the first inductor with the first electrode and a ground, the second circuit has a second inductor connected between the second electrode and the second bias power source, and a second capacitor connected between a node on an electrical path connecting the second inductor with the second electrode and a ground, and the one or more variable circuit elements include at least one of the second inductor or the second capacitor.
 5. The inspection method according to claim 1, wherein the first circuit has a first resistor connected between the first electrode and the first bias power source, and a first capacitor connected between a node on an electrical path connecting the first resistor with the first electrode and a ground, the second circuit has a second resistor connected between the second electrode and the second bias power source, and a second capacitor connected between a node on an electrical path connecting the second resistor with the second electrode and a ground, and the one or more variable circuit elements include at least one of the second resistor or the second capacitor.
 6. The inspection method according to claim 1, wherein the first circuit has a first inductor connected between the first electrode and the first bias power source, and a first capacitor connected between a node on an electrical path connecting the first inductor with the first electrode and a ground, the second circuit has a second inductor connected between the second electrode and the second bias power source, and a second capacitor connected between a node on an electrical path connecting the second inductor with the second electrode and a ground, and the one or more variable circuit elements include at least one of the second inductor or the second capacitor.
 7. The inspection method according to claim 1, wherein said acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring is performed in a state where a third inspection circuit having impedance is connected to the substrate through the first inspection circuit and connected to the edge ring through the second inspection circuit.
 8. The inspection method according to claim 7, wherein the third inspection circuit has impedance corresponding to impedance of plasma.
 9. The inspection method according to claim 7, wherein said acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring is performed in a state where a fourth inspection circuit having impedance is connected to the substrate through the third inspection circuit and the first inspection circuit and a fifth inspection circuit having impedance is connected to the edge ring through the third inspection circuit and the second inspection circuit.
 10. The inspection method according to claim 8, wherein said acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring is performed in a state where a fourth inspection circuit having impedance is connected to the substrate through the third inspection circuit and the first inspection circuit and a fifth inspection circuit having impedance is connected to the edge ring through the third inspection circuit and the second inspection circuit.
 11. The inspection method according to claim 9, wherein the fourth inspection circuit has impedance corresponding to impedance of a plasma sheath that is generated further above a plasma sheath on the substrate with a plasma interposed therebetween, and the fifth inspection circuit has impedance corresponding to impedance of a plasma sheath that is generated further above a plasma sheath on the edge ring with the plasma interposed therebetween.
 12. The inspection method according to claim 1, wherein each of the first electrical bias and the second electrical bias is a pulse wave that includes a pulse of a negative voltage and is periodically generated at a cycle that is defined by the bias frequency.
 13. The inspection method according to claim 12, wherein the pulse of the negative voltage is a pulse of a negative direct-current voltage.
 14. The inspection method according to claim 1, wherein each of the first electrical bias and the second electrical bias is radio frequency power having the bias frequency.
 15. An inspection method comprising: connecting a first inspection circuit having impedance to a substrate placed on a first region of a substrate support of a plasma processing apparatus; connecting a second inspection circuit having impedance to an edge ring placed on a second region of the substrate support; applying a first electrical bias and a second electrical bias from a first bias power source and a second bias power source to a first electrode in the first region and a second electrode in the second region, respectively, in a state where the first inspection circuit is connected to the substrate and the second inspection circuit is connected to the edge ring, the first electrical bias and the second electrical bias having a common bias frequency; and acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring by using a waveform monitor while said applying a first electrical bias and a second electrical bias, wherein the first inspection circuit has impedance corresponding to impedance of a plasma sheath on the substrate, and the second inspection circuit has impedance corresponding to impedance of a plasma sheath on the edge ring.
 16. The inspection method according to claim 15, wherein each of the first inspection circuit and the second inspection circuit includes a diode, a resistor, and a capacitor connected in parallel with each other.
 17. An inspection apparatus comprising: a first inspection circuit configured to be connectable to a substrate placed on a first region of a substrate support of a plasma processing apparatus, and having impedance; a second inspection circuit configured to be connectable to an edge ring placed on a second region of the substrate support, and having impedance; and a waveform monitor configured to acquire a voltage waveform of the substrate and a voltage waveform of the edge ring in a state where first and second electrical biases having a common bias frequency are respectively applied to a first electrode in the first region and a second electrode in the second region, wherein the first inspection circuit has impedance corresponding to impedance of a plasma sheath on the substrate, and the second inspection circuit has impedance corresponding to impedance of a plasma sheath on the edge ring.
 18. A plasma processing apparatus comprising: a substrate support including a first region having a first electrode therein and a second region having a second electrode therein; an inspection apparatus; a first bias power source configured to apply a first electrical bias to the first electrode; a second bias power source configured to apply a second electrical bias to the second electrode, the first electrical bias and the second electrical bias having a common bias frequency; a first circuit connected between the first bias power source and the first electrode; and a second circuit connected between the second bias power source and the second electrode, the second circuit having one or more variable circuit elements; and a controller, wherein the inspection apparatus includes a first inspection circuit configured to be connectable to a substrate placed on the first region of the substrate support, and having impedance; a second inspection circuit configured to be connectable to an edge ring placed on the second region of the substrate support, and having impedance; and a waveform monitor configured to acquire a voltage waveform of the substrate and a voltage waveform of the edge ring in a state where the first electrical bias and the second electrical bias are respectively applied to the first electrode in the first region and the second electrode in the second region, and the controller is configured to perform: applying the first electrical bias and the second electrical bias from the first bias power source and the second bias power source to the first electrode and the second electrode, respectively, in a state where the first inspection circuit is connected to the substrate and the second inspection circuit is connected to the edge ring; acquiring a voltage waveform of the substrate and a voltage waveform of the edge ring by using the waveform monitor, while said applying the first electrical bias and the second electrical bias; and adjusting impedance of the second circuit by adjusting a variable element parameter of each of the one or more variable circuit elements such that the impedance of the second circuit is higher than impedance of the first circuit at the bias frequency and a difference between the voltage waveform of the substrate and the voltage waveform of the edge ring is reduced.
 19. The inspection apparatus according to claim 17, wherein each of the first inspection circuit and the second inspection circuit includes a diode, a resistor, and a capacitor connected in parallel with each other.
 20. The plasma processing apparatus according to claim 18, wherein each of the first inspection circuit and the second inspection circuit includes a diode, a resistor, and a capacitor connected in parallel with each other. 